Kirtley Scientific - John R. Kirtley
 

Scanning tunneling
potentiometry

 

I developed a new technique for measuring the electrochemical potential of a surface using a scanning tunneling microscope, and demonstrated a sensitivity approaching the Johnson noise limit.

  • "Scanning tunneling measurements of potential steps at grain boundaries in the presence of current flow", J.R. Kirtley, S. Washburn, and M.J. Brady, IBM Journal of Research and Development, May 1988.

  • "Direct measurement of potential steps at grain boundaries in the presence of current flow", J.R. Kirtley, S. Washburn, and M.J. Brady, Phys. Rev. Lett. 60,1546(1988).
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